Characterization of defects

We have developed a method to visualize defects in transparent coatings deposited on a transparent substrate, which allows us to analyze (and to map) the surface of samples up to hundreds of cm2 in size. The method, based on oxygen plasma etching, renders defects visible by optical microscopy. Pinholes, scratches, cracks and other types of defects can easily be distinguished this way, and their number density can be quantified. The method can also provide information about defect patterns on a macroscopic scale, thus facilitating diagnostics, quality control and the improvement of fabrication procedures.

Pinholes	Pinhole patterns	Cracks

Pinhole in the coating	Micro-scratch	Cracks

NPI offers services in defect detection and characterization.

We will help to identify the cause of unexpected barrier failure, to identify the source(s) of the defects, be it the coating process itself, converting, handling, aging, or others.